摘要: We report on using synthetic silicon for a high-precision X-ray polarimeter comprising a polarizer and an analyzer, each based on a monolithic channel-cut crystal used at multiple Brewster reflections with a Bragg angle very close to 45°. Experiments were performed at the BL09B bending magnet beamline of the Shanghai Synchrotron Radiation Facility using a Si(800) crystal at an X-ray energy of 12.914 keV. A polarization purity of 8.4×10-9 was measured. This result is encouraging, as the measured polarization purity is the best-reported value for the bending magnet source. Notably, this is the firstly systematic study on the hard X-ray polarimeter in China, which is crucial for exploring new physics, such as verifying vacuum birefringence.
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来自:
Shangyu Si
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分类:
物理学
>>
核物理学
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投稿状态:
已被期刊接收
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引用:
ChinaXiv:202402.00099
(或此版本
ChinaXiv:202402.00099V1)
DOI:10.12074/202402.00099V1
CSTR:32003.36.ChinaXiv.202402.00099.V1
- 推荐引用方式:
Si, Shangyu,Li, Zhongliang,Jia, Wenhong,Xue, Lian,Luo, Hongxin,Xu, Jiancai,Shen, Baifei,Zhang, Lingang,Ji, Liangliang,Leng, Yuxin,Tai, Renzhong.(2024).High-precision X-ray polarimeter based on channel-cut crystals.中国科学院科技论文预发布平台.doi:10.12074/202402.00099V1
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