分类: 核科学技术 >> 核探测技术与核电子学 提交时间: 2023-06-18 合作期刊: 《Nuclear Science and Techniques》
摘要: Single event effects (SEEs) induced by radiations become a significant reliability challenge for modern electronic systems. To evaluate SEEs susceptibility for microelectronic devices and integrated circuits (ICs), an SEE testing system with flexibility and robustness was developed at Heavy Ion Research Facility in Lanzhou (HIRFL). The system is compatible with various types of microelectronic devices and ICs, and supports plenty of complex and high-speed test schemes and plans for the irradiated devices under test (DUTs). Thanks to the combination of meticulous circuit design and the hardened logic design, the system has additional performances to avoid an overheated situation and irradiations by stray radiations. The system has been tested and verified by experiments for irradiating devices at HIRFL.
分类: 物理学 >> 核物理学 提交时间: 2024-01-10
摘要: 兰州重离子加速器冷却储存环上的等时性质量谱仪是开展高电荷态、短寿命同核异能态衰变研究的理想装置。在短寿命高电荷态离子94mRu44+ 的寿命测量实验中,我们直接观测到了94Ru的8+态isomer衰变到基态的过程。在观测时间窗口(20 s, 180 s)范围内,鉴别出了49 个衰变事件。为了能够鉴别出更多的衰变事件,本文研究了一种基于频谱幅度来指认衰变事件的方法。基于模拟结果,该方法可以有效指认(15 s,185 s) 内的衰变事件。将新的鉴别方法应用到实验数据处理中,在(15 s, 185 s)内,鉴别出了54个衰变事件。基于这54个衰变事件,计算得到94mRu44+在运动坐标系下的寿命为194(121) s。新的寿命结果于之前的结果218(148) s 在误差范围内,具有更高的精确度。