摘要: In order to do alignment between the timing signal and the synchrotron X-ray pulse on the sample spot in the time domain, measuring time structure of the storage ring on the sample spot inside the experimental hutch is a foundational step during the time-resolved experiments using the pulsed synchrotron X-rays with the time structure defined by the storage ring. In this work, the method of time-resolved X-ray excited optical luminescence (TRXEOL) was designed and implemented to do the measurement. It is based on the principle of time-correlated single photon counting techniques. The measurement system consists of a spectrometer with a detector of photomultiplier tube, a timing system, a set of nuclear instrument modules and a luminescent material of zinc oxide. The measurement was performed on the X-ray absorbed fine structure spectrum beamline at Shanghai Synchrotron Radiation Facility. The results show that this method can be used to measure the time structure of the storage ring with a precision of less than 1 ns. The measurement system can also be used for the time-resolved research for the optical luminescent materials.