摘要: Quantitative investigation is conducted on the resistance sources of the components in the NiOeYSZ/ YSZ/GDC/LSCFeGDC solid oxide electrolysis cell (SOEC) stack at the H2O/H2 ratios of 70/30, 80/20 and 90/ 10 at 750 C. The results indicate that the cell resistance accounts for 76.3e66.7% of that of the stack repeating unit (SRU), the contact resistance (CR) between the air electrode current-collecting layer (AECCL) and the interconnect accounts for 23.6e27.0%, the CR between the hydrogen electrode current- collecting layer (HECCL) and the interconnect only accounts for 2.3e3.2%, and the resistance of the interconnect can be neglected. Duration test of the stack is conducted at 0.8 A cm 2 for 380 h, the cell resistance increase is found to be the major contribution of the SRU degradation (82.2% of the SRU degradation) while the air electrode CR increase and the hydrogen electrode CR increase are other two important factors.
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期刊:
JOURNAL OF POWER SOURCES
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分类:
物理学
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普通物理:统计和量子力学,量子信息等
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引用:
ChinaXiv:201705.00437
(或此版本
ChinaXiv:201705.00437V1)
DOI:10.12074/201705.00437V1
CSTR:32003.36.ChinaXiv.201705.00437.V1
- 推荐引用方式:
Zheng, YF [Zheng, Yifeng][ 1 ],Li, QS [Li, Qingshan][ 1 ],Chen, T [Chen, Tao][ 1 ],Xu, C [Xu, Cheng][ 1 ],Wang, WG [Wang, Wei Guo][ 1 ].(2017).Quantitative contribution of resistance sources of components to stack performance for solid oxide electrolysis cells.JOURNAL OF POWER SOURCES.[ChinaXiv:201705.00437]
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