摘要: It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with multi-gap resistive plate chamber (MRPC), aiming at overall time resolution about 80 ps. After the entire electronics system is ready, some experiments, such as heat radiating, irradiation hardness and large-current beam tests,are carried out to certify the electronics' reliability and stability. The on-detector test of the electronics is also performed with the beam at BEPCII E3 line, the test results indicate that the electronics system fulfills its design requirements.
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分类:
物理学
>>
核物理学
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引用:
ChinaXiv:201609.00002
(或此版本
ChinaXiv:201609.00002V1)
doi:10.12074/201609.00002
CSTR:32003.36.ChinaXiv.201609.00002.V1
- 推荐引用方式:
WANG Xiao-Zhuang,DAI Hong-Liang,WU Zhi,HENG Yue-Kun,Zhang Jie,CAO Ping,JI Xiao-Lu,Li Cheng,SUN Wei-Jia,WANG Si-Yu,WANG Yun.(2016).The test of the electronics system for the BESIII ETOF upgrade.中国科学院科技论文预发布平台.[ChinaXiv:201609.00002]
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